Teledyne LeCroy today introduced its WaveRunner 9000 Series mixed-signal oscilloscopes with a large, 15.4” display, bandwidths from 500 MHz to 4 GHz, and sample rates up to 40 GS/s. The WaveRunner 9000 Seriesoffers the industry’s deepest toolbox and the most complete collection of serial data debug and validation solutions, making it ideal for embedded system, automotive, and EMC/EMI test applications.
The ubiquity of embedded computing systems with high-speed microprocessors drives industry demand for mid-range, mixed-signal oscilloscopes with high bandwidth and powerful debug and validation toolsets. However, equipment budgets have not kept pace with the increase in microprocessor speed and complexity. This has forced engineers and managers to sacrifice certain capabilities in their test equipment. Teledyne LeCroy’s WaveRunner 9000 oscilloscopes offers all of the critical features—a large display, powerful toolbox, wide range of bandwidths, and enhanced resolution up to 11 bits—at an affordable price.
The WaveRunner 9000 Series offers the industry’s deepest toolbox with a large 15.4” display at a price point that does not require engineers to sacrifice features or performance,” said Tyler Cox, VP and general manager for oscilloscopes/digitizers. “The vast serial data coverage of these new oscilloscopes makes them perfect for embedded/automotive testing, and the 40 GS/s sampling rate is ideal for EMI/EMC testing.
About the WaveRunner 9000
The WaveRunner 9000 offers a huge array of test, debug, and validation tools, making it well suited for comprehensive testing of embedded computing systems. The widest selection of serial data triggering and decode (TD) packages provides powerful, flexible serial triggering with an intuitive color-coded decode overlay. Additionally, unique measure/graph and eye-diagram test (TDME) packages complement the TD packages by enabling extraction of decoded data and subsequent waveform data plots, performing bus timing measurements, and creating eye diagrams for testing against standard or custom masks. This set of tools provides exhaustive causal analysis for not only embedded systems but also automotive applications, covering all aspects of Automotive Ethernet validation and debug, including 1000Base-T1 and 100Base-T1 compliance test.